NIST - National Institute of Standards and Technology

09/09/2024 | Press release | Archived content

Statistical study and parallelization of multiplexed single-electron sources

S. Norimoto, P. See, N. Schoinas, I. Rungger, T. O. Boykin, M. D. Stewart, J. P. Griffiths, C. Chen, D. A. Ritchie, M. Kataoka; Statistical study and parallelization of multiplexed single-electron sources. Appl. Phys. Lett. 9 September 2024; 125 (11): 113501. https://doi.org/10.1063/5.0225998

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